Teradyne builds automated test equipment (ATE) Tests on a device unter test (DUT) Do wafer level testing or packaged parts Do a lot of Soc (System on a Chip) which basically is a chip with all of the features of a computer plus some application specific stuff all on a single substrate. It will likely have a microcontroller or microprocessor, and could have any of - a graphics processing unit (GPU), a Wi-Fi module, a coprocessor, memory (RAM, ROM, EEPROM, Flash, ...), ADC's, DAC's, external interfaces (USB, FireWire, Ethernet, USART, SPI), voltage regulators and power management circuits A SiP is similar to an SoC, but "System in a Package" Field Programmable Gate Array --> FPGA Complex Programmable Logic Device --> CPLD PMIC --> Power Management IC. Typically has DC-DC converters, battery charging, power source selection, votlage scaling, voltage regulation, power sequencing Apple 338S1164 PMIC manufactured by Dialog Semiconductors MediaTek MT6329BA PMIC used in LG mobile phones Teradyne Divisions Semiconductor Test Digital / Mixed Signal UltraFLEX UltraFLEX-HD (12-slot), UltraFLEX-SC (24-slot), UltraFLEX-XC (36-slot) Options - (many others avail) UltraVI80 - 80 independent pins of "3-in-1" capability - voltage source / current source / measurement. Termed "VI" function DC30 and DC75 - voltage/current supplies extend DC capability to 30V and 75V. Contain precision voltmeter and time measurement J750 is the industry standard cost-effective microcontroller, FPGA, digital audio/baseband devices. Used for wafer sort and final test RF options --> LitePoint IQxel-M and IQxtream Linear, Power & Automotive ETS-800 --> automotive test platform --> automotive IC's, power and battery management, high-efficiency lighting and LED drivers, motor controllers, general purpose analog and mixed-signal devices. Options include APU-32 --> 32 channel 80V four quadrant VI with 8 current ranges from 1uA to 200mA and per pin AWG and digitizing capabilities SPU-2112 (smart pin 100V / 10A) +- 100V with 8 current ranges UPU-64 --> 64 channels 20 MHz high voltage digital (-1V to +24V), 2x8 force / sense mux, PMU FLEX / microFLEX - cost efficient audio, video, power management, automotive, hard disk drive controllers, low cost mixed-signal devices, low cost analog devices Memory Magnum --> low cost non-volitile memory, SRAM, and logic devices 50 MHz pattern rate and 100Mbps DDR (double data rate) Magnum V --> ultra-high performance FLASH and DRAM memories Teradyne has three principal families of testers J750 FLEX UltraFlex - SoC capable including mixed signal Assembly Test Division builds testers for completed circuit boards Industrial automation is a more general term and collaborative robots would fall into this catagory, which is the Universal Robots division. (Cobots)